Transmission Electron Microscopy Analysis Of Shot Peening Strengthened Layer For Some Industrial Alloys

Author:  J.Y. Wang, Y.X Tan, R.H Zhu
Source:  Conf Proc: ICSP-4, (p.191-198)
Doc ID:  1990095
Year of Publication:  1990
Abstract:  
Substructure variation along the shot peened layer can clearly be observed by transmission electron microscopy (TEM) using layer by layer analysis and the cause of surface strengthening for shot peening can be explained. Experimental results are obtained as follows: 1) Microdeformation twin is the main substructure in the shot peening layer of x-brass or stainless steel; 2) Dislocation cell is the main substructure in the peened layer of low carbon steel; 3) Shot peening can not change the dislocation array in martensitic steels; 4) The array of surface substructure will greatly influence the residual stress distribution and the fatigue strength of relevant alloys. Descriptors: Transmission electron microscopy; Shot peening; Microstructure; Substructure; Dislocation